Quantifying protein adsorption on combinatorially sputtered Al-, Nb-, Ta- and Ti-containing films with electron microprobe and spectroscopic ellipsometry

T. M. Byrne, L. Lohstreter, M. J. Filiaggi, Zhijun Bai, J. R. Dahn

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

11 Citas (Scopus)

Resumen

Although metallic biomaterials are widely used, systematic studies of protein adsorption onto such materials are generally lacking. Combinatorial binary libraries of Al1-xNbx, Al1-xTax, Al1-xTix, Nb1-xTax, Nb1-xTix, and Ta1-xTix (0 ≤ x ≤ 1) and a ternary library of Al1-xTixTay (0 ≤ x ≤ 1 and 0 ≤ y ≤ 0.7), along with their corresponding pure element films were sputtered onto glass substrates using a unique magnetron sputtering technique. Films were characterized with wavelength-dispersive spectroscopy (WDS), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). Fibrinogen and albumin adsorption amounts were measured by wavelength-dispersive spectroscopy (WDS) and spectroscopic ellipsometry (SE) equipment, both high throughput techniques with automated motion stage capabilities. Protein adsorption onto these films was found to be closely correlated to the alumina surface fraction, with high alumina content at the surface leading to low amounts of adsorbed fibrinogen and albumin. Protein adsorption amounts obtained with WDS and SE were in good agreement for all films.

Idioma originalEnglish
Páginas (desde-hasta)992-1001
Número de páginas10
PublicaciónSurface Science
Volumen603
N.º7
DOI
EstadoPublished - abr. 1 2009

ASJC Scopus Subject Areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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