Quantifying protein adsorption on combinatorially sputtered Al-, Nb-, Ta- and Ti-containing films with electron microprobe and spectroscopic ellipsometry

T. M. Byrne, L. Lohstreter, M. J. Filiaggi, Zhijun Bai, J. R. Dahn

Résultat de recherche: Articleexamen par les pairs

11 Citations (Scopus)

Résumé

Although metallic biomaterials are widely used, systematic studies of protein adsorption onto such materials are generally lacking. Combinatorial binary libraries of Al1-xNbx, Al1-xTax, Al1-xTix, Nb1-xTax, Nb1-xTix, and Ta1-xTix (0 ≤ x ≤ 1) and a ternary library of Al1-xTixTay (0 ≤ x ≤ 1 and 0 ≤ y ≤ 0.7), along with their corresponding pure element films were sputtered onto glass substrates using a unique magnetron sputtering technique. Films were characterized with wavelength-dispersive spectroscopy (WDS), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). Fibrinogen and albumin adsorption amounts were measured by wavelength-dispersive spectroscopy (WDS) and spectroscopic ellipsometry (SE) equipment, both high throughput techniques with automated motion stage capabilities. Protein adsorption onto these films was found to be closely correlated to the alumina surface fraction, with high alumina content at the surface leading to low amounts of adsorbed fibrinogen and albumin. Protein adsorption amounts obtained with WDS and SE were in good agreement for all films.

Langue d'origineEnglish
Pages (de-à)992-1001
Nombre de pages10
JournalSurface Science
Volume603
Numéro de publication7
DOI
Statut de publicationPublished - avr. 1 2009

ASJC Scopus Subject Areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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Citer

Byrne, T. M., Lohstreter, L., Filiaggi, M. J., Bai, Z., & Dahn, J. R. (2009). Quantifying protein adsorption on combinatorially sputtered Al-, Nb-, Ta- and Ti-containing films with electron microprobe and spectroscopic ellipsometry. Surface Science, 603(7), 992-1001. https://doi.org/10.1016/j.susc.2009.02.014