Quantifying protein adsorption on combinatorially sputtered Al-, Nb-, Ta- and Ti-containing films with electron microprobe and spectroscopic ellipsometry
T. M. Byrne, L. Lohstreter, M. J. Filiaggi, Zhijun Bai, J. R. Dahn
Profundice en los temas de investigación de 'Quantifying protein adsorption on combinatorially sputtered Al-, Nb-, Ta- and Ti-containing films with electron microprobe and spectroscopic ellipsometry'. En conjunto forman una huella única.