Gouy phase shift measurement using interferometric second-harmonic generation

Stéphane Bancelin, Jarno N. van der Kolk, Andrew S. Quigley, Maxime Pinsard, Samuel P. Veres, Laurent Kreplak, Lora Ramunno, F. Pinsard

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We report on a simple way to directly measure the Gouy phase shift of a strongly focused laser beam. This is accomplished by using a recent technique, namely, interferometric second-harmonic generation. We expect that this method will be of interest in a wide range of research fields, from high-harmonic and attosecond pulse generation to femtochemistry and nonlinear microscopy.

Original languageEnglish
Pages (from-to)1958-1961
Number of pages4
JournalOptics Letters
Volume43
Issue number9
DOIs
Publication statusPublished - May 1 2018

Bibliographical note

Funding Information:
Canada Foundation for Innovation (CFI); Natural Sciences and Engineering Research Council of Canada (NSERC); Fonds de Recherche du Québec—Nature et Technologies (FRQNT).

Funding Information:
Funding. Canada Foundation for Innovation (CFI); Natural Sciences and Engineering Research Council of Canada (NSERC); Fonds de Recherche du Québec—Nature et Technologies (FRQNT).

Publisher Copyright:
© 2018 Optical Society of America.

ASJC Scopus Subject Areas

  • Atomic and Molecular Physics, and Optics

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Bancelin, S., van der Kolk, J. N., Quigley, A. S., Pinsard, M., Veres, S. P., Kreplak, L., Ramunno, L., & Pinsard, F. (2018). Gouy phase shift measurement using interferometric second-harmonic generation. Optics Letters, 43(9), 1958-1961. https://doi.org/10.1364/OL.43.001958