Gouy phase shift measurement using interferometric second-harmonic generation

Stéphane Bancelin; Jarno N. van der Kolk; Andrew S. Quigley; Maxime Pinsard; Samuel P. Veres; Laurent Kreplak; Lora Ramunno; F. Pinsard

doi:10.1364/OL.43.001958

Gouy phase shift measurement using interferometric second-harmonic generation

Stéphane Bancelin, Jarno N. van der Kolk, Andrew S. Quigley, Maxime Pinsard, Samuel P. Veres, Laurent Kreplak, Lora Ramunno, F. Pinsard

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

2 Citas (Scopus)

Resumen

We report on a simple way to directly measure the Gouy phase shift of a strongly focused laser beam. This is accomplished by using a recent technique, namely, interferometric second-harmonic generation. We expect that this method will be of interest in a wide range of research fields, from high-harmonic and attosecond pulse generation to femtochemistry and nonlinear microscopy.

Idioma original	English
Páginas (desde-hasta)	1958-1961
Número de páginas	4
Publicación	Optics Letters
Volumen	43
N.º	9
DOI	https://doi.org/10.1364/OL.43.001958
Estado	Published - may. 1 2018

Nota bibliográfica

Funding Information:
Canada Foundation for Innovation (CFI); Natural Sciences and Engineering Research Council of Canada (NSERC); Fonds de Recherche du Québec—Nature et Technologies (FRQNT).

Funding Information:
Funding. Canada Foundation for Innovation (CFI); Natural Sciences and Engineering Research Council of Canada (NSERC); Fonds de Recherche du Québec—Nature et Technologies (FRQNT).

Publisher Copyright:
© 2018 Optical Society of America.

ASJC Scopus Subject Areas

Atomic and Molecular Physics, and Optics

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10.1364/OL.43.001958

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AU - Veres, Samuel P.

AU - Kreplak, Laurent

AU - Ramunno, Lora

AU - Pinsard, F.

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Gouy phase shift measurement using interferometric second-harmonic generation

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Nota bibliográfica

ASJC Scopus Subject Areas

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