Gouy phase shift measurement using interferometric second-harmonic generation

Stéphane Bancelin; Jarno N. van der Kolk; Andrew S. Quigley; Maxime Pinsard; Samuel P. Veres; Laurent Kreplak; Lora Ramunno; F. Pinsard

doi:10.1364/OL.43.001958

Gouy phase shift measurement using interferometric second-harmonic generation

Stéphane Bancelin, Jarno N. van der Kolk, Andrew S. Quigley, Maxime Pinsard, Samuel P. Veres, Laurent Kreplak, Lora Ramunno, F. Pinsard

Résultat de recherche: Article › examen par les pairs

2 Citations (Scopus)

Résumé

We report on a simple way to directly measure the Gouy phase shift of a strongly focused laser beam. This is accomplished by using a recent technique, namely, interferometric second-harmonic generation. We expect that this method will be of interest in a wide range of research fields, from high-harmonic and attosecond pulse generation to femtochemistry and nonlinear microscopy.

Langue d'origine	English
Pages (de-à)	1958-1961
Nombre de pages	4
Journal	Optics Letters
Volume	43
Numéro de publication	9
DOI	https://doi.org/10.1364/OL.43.001958
Statut de publication	Published - mai 1 2018

Note bibliographique

Funding Information:
Canada Foundation for Innovation (CFI); Natural Sciences and Engineering Research Council of Canada (NSERC); Fonds de Recherche du Québec—Nature et Technologies (FRQNT).

Funding Information:
Funding. Canada Foundation for Innovation (CFI); Natural Sciences and Engineering Research Council of Canada (NSERC); Fonds de Recherche du Québec—Nature et Technologies (FRQNT).

Publisher Copyright:
© 2018 Optical Society of America.

ASJC Scopus Subject Areas

Atomic and Molecular Physics, and Optics

Accès au document

10.1364/OL.43.001958

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AU - Bancelin, Stéphane

AU - van der Kolk, Jarno N.

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AU - Veres, Samuel P.

AU - Kreplak, Laurent

AU - Ramunno, Lora

AU - Pinsard, F.

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Gouy phase shift measurement using interferometric second-harmonic generation

Résumé

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ASJC Scopus Subject Areas

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